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无透镜磁光成像。

Lensless magneto-optical imaging.

作者信息

Neu V, Pedrini G, Soldatov I, Reichelt S, Schäfer R

机构信息

Leibniz Institute for Solid State and Materials Research Dresden, 01099, Dresden, Germany.

Institute of Applied Optics (ITO), University of Stuttgart, 70569, Stuttgart, Germany.

出版信息

Sci Rep. 2025 Aug 2;15(1):28277. doi: 10.1038/s41598-025-10005-1.

Abstract

Magneto-optical methods, which utilize the interaction of polarized light with the magnetization of the sample in reflection through the magneto-optical Kerr effect or in transmission through the accordant Faraday effect, present prominent and widespread optical microscopy techniques for studying magnetic microstructures. In non-magnetic light microscopy, several alternatives to lens-based imaging have been developed, which offer various advantages, including an improved ratio of field-of-view to magnification. Selected lensless methods also provide access to both intensity and phase information of the probing light field, which presents an additional information channel obtainable from the studied sample. In a proof-of-principle study we verify that the reconstructed magneto-optical intensity obtained from a lensless multiplane recording scheme is in full qualitative agreement with conventional lens-based Faraday microscopy. The additional phase information, not accessible with conventional methods, offers direct access to domain information through the imaginary part of the Faraday or Kerr component in the studied material and allows domain imaging even in a crossed analyzer position or without the use of an analyzer. These findings will open the path to exploit the various established advantages of lensless microscopy for the magneto-optical investigation of magnetic materials.

摘要

磁光方法利用偏振光与样品磁化强度之间的相互作用,通过磁光克尔效应在反射中或通过相应的法拉第效应在透射中来研究磁性微观结构,是用于研究磁性微观结构的重要且广泛应用的光学显微镜技术。在非磁性光学显微镜中,已经开发出了几种基于透镜成像的替代方法,这些方法具有各种优点,包括提高了视场与放大倍数的比率。选定的无透镜方法还可以获取探测光场的强度和相位信息,这为从被研究样品中获取额外的信息通道提供了可能。在一项原理验证研究中,我们验证了从无透镜多平面记录方案获得的重建磁光强度与传统的基于透镜的法拉第显微镜在完全定性上是一致的。传统方法无法获得的额外相位信息,通过被研究材料中法拉第或克尔分量的虚部提供了直接获取磁畴信息的途径,甚至在交叉偏振器位置或不使用偏振器的情况下也能进行磁畴成像。这些发现将为利用无透镜显微镜的各种既定优势对磁性材料进行磁光研究开辟道路。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/952c/12317973/e9a6bb9847c5/41598_2025_10005_Fig1_HTML.jpg

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