Kim Sangwoo, Oh Sukhoon
Department of Radiological Science, Daewon University College, Jecheon, Republic of Korea.
Center for Bio-Imaging and Translational Research, Korea Basic Science Institute, Cheongju, Republic of Korea.
Quant Imaging Med Surg. 2025 Aug 1;15(8):7555-7562. doi: 10.21037/qims-24-2140. Epub 2025 Jul 24.
This study assessed the accuracy of a T1-based temperature measurement technique for metal-inserted materials using 3T magnetic resonance imaging (MRI). A variable flip angle (VFA) sequence with dual echoes was used to obtain images of a phantom and an experiment. T1 values were calculated when the metal-inserted materials were subjected to heating and were acquired in the proximity of the metal implant of the phantom and tissue. The values were converted into temperature measurements using a fiber-optic thermal sensor (FOS) that was placed within the metal substances. Additionally, proton resonance frequency shift (PRFS) was calculated from phase images acquired with the dual echoes, which allow for a comparison of temperature fidelity between the VFA and PRFS techniques. In the phantom experiment, the root mean square temperature error based on T1 values was approximately 0.12 ℃, which was comparable to that obtained from the FOS. In contrast, the PRFS demonstrated a substantial temperature measurement error of approximately 11.21 ℃, as determined by the root mean square calculation. A similar pattern was observed in the experiment, where the T1-based temperature measurement error was minimal at approximately 0.30 ℃, while the PRFS-based temperature measurement error was considerably higher at around 5.44 ℃. These findings indicate that the VFA technique enables precise monitoring of temperature alterations in metal-inserted materials, engendering its incorporation into clinical MRI sequences for temperature assessment during magnetic resonance radiofrequency (RF) exposure.
本研究使用3T磁共振成像(MRI)评估了一种基于T1的温度测量技术对金属植入材料的准确性。采用具有双回波的可变翻转角(VFA)序列获取体模和实验的图像。当金属植入材料受热时计算T1值,并在体模和组织的金属植入物附近采集。使用置于金属物质内的光纤热传感器(FOS)将这些值转换为温度测量值。此外,从双回波采集的相位图像计算质子共振频率偏移(PRFS),这使得能够比较VFA和PRFS技术之间的温度保真度。在体模实验中,基于T1值的均方根温度误差约为0.12℃,与FOS获得的结果相当。相比之下,通过均方根计算确定,PRFS显示出约11.21℃的显著温度测量误差。在实验中观察到类似模式,基于T1的温度测量误差最小,约为0.30℃,而基于PRFS的温度测量误差则高得多,约为5.44℃。这些发现表明,VFA技术能够精确监测金属植入材料中的温度变化,促使其纳入临床MRI序列,用于磁共振射频(RF)暴露期间的温度评估。