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Spectral Evidence of Correlation-Controlled Metal-Insulator Transition in NdSrNiO Thin Films.

作者信息

Xu Rui, Ye Huan, Wang Yuzhe, Yao Jianghao, Li Xianglin, Wei Long, Zhao Zhisheng, Liao Sen, Li Peng, Li Chihao, Peng Rui, Liu Zhengtai, Shen Dawei, Chen Kai, Wang Yilin, Wang Lingfei, Feng Donglai, Jiang Juan

机构信息

Hefei National Research Center for Physical Sciences at Microscale and School of Emergent Technology, University of Science and Technology of China, Hefei 230026, China.

New Cornerstone Science Laboratory, Hefei National Laboratory, Hefei 230088, China.

出版信息

Nano Lett. 2025 Aug 20;25(33):12524-12531. doi: 10.1021/acs.nanolett.5c02559. Epub 2025 Aug 11.

Abstract

Epitaxial growth serves as a critical platform for tailoring electronic interactions. Here, we synthesized high-quality NdSrNiO thin films on (LaSr)(AlTa)O (LSAT) (001) and SrTiO (STO) (001) substrates and systematically investigated the effects of substrate strain and chemical doping on their low-energy electronic structures using angle-resolved photoemission spectroscopy (ARPES). Transport measurements reveal that Sr doping strongly suppresses the metal-insulator transition (MIT) temperature on both substrates, with accelerated suppression in STO (001)-grown samples. Our ARPES results reveal that beyond a chemical potential shift, Sr doping significantly alters the effective mass, with a larger change observed in NdSrNiO/STO (001) than in LSAT-based films. These findings indicate that Sr doping, combined with epitaxial strain, alters the correlation strength, thereby modifying the MIT. Our results unravel the intricate interplay among multiple degrees of freedom in NdSrNiO thin films, deepening the understanding of nickelate-based heterostructure design and engineering.

摘要

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