Alcock Simon G, Nistea Ioana-Theodora, Bazan da Silva Murilo, Sawhney Kawal, Niewrzella Norman, Lasser Holger, Vivo Amparo, Barrett Ray, Buchheim Jana, Gwalt Grzegorz, Siewert Frank, Spielmann Sibylle, Flechsig Uwe, Schmidtchen Silja, Vannoni Maurizio, Nicolas Josep, Thomasset Muriel, Polack Francois
Diamond Light Source Ltd, Harwell Science and Innovation Campus, Didcot OX11 0DE, United Kingdom.
ZEISS, SMT GmbH, Carl-Zeiss-Str. 22, 73447 Oberkochen, German.
Rev Sci Instrum. 2025 Aug 1;96(8). doi: 10.1063/5.0287341.
The surface quality of x-ray mirrors is a major constraint on optical performance at synchrotron light and free electron laser facilities. A limiting factor for creating state-of-the-art optics is the accuracy of metrology data to deterministically guide the polishing tool to correct surface errors. The "MooNpics" (Metrology On One-Nanometer-Precise Optics) collaboration aims to improve optical metrology capabilities at European facilities to enable reproducible measurement of long or curved optics with height errors <1 nm rms and slope errors <100 nrad rms. Three challenging x-ray optics were measured by several labs using a variety of instruments. The mirrors, chosen to challenge and explore different aspects of optical metrology, were as follows: a 1 m-long, ultra-flat (radius of curvature R > 100 km); an ellipse with added parabolic arcs; and a strongly curved sphere (R ∼ 9.3 m) with an added spatially varying chirp. This study highlighted calibration issues with several instruments, which were subsequently corrected. In this paper, we present results about the ellipse mirror. Based on metrology data provided by the collaboration, two cycles of ion beam figuring improved all aspects of the mirror, including correcting the ellipse parameters, reducing high- and mid-frequency spatial polishing errors, and refining the shape of the parabolic arcs. Overall, the slope and height errors were improved by a factor of ∼10. We also show how the round-robin measurement exercise helped refine "best practice" procedures for mounting optics, alignment, and data acquisition and analysis methods. It is hoped that this collaborative project will ignite further improvements in the production quality of x-ray optics to benefit many scientific communities around the world.
X射线反射镜的表面质量是同步辐射光源和自由电子激光设施光学性能的主要限制因素。制造先进光学元件的一个限制因素是计量数据的准确性,以便确定性地引导抛光工具校正表面误差。“MooNpics”(一纳米精度光学元件的计量)合作项目旨在提高欧洲设施的光学计量能力,以实现对长度较长或弯曲的光学元件进行可重复测量,其高度误差<1纳米均方根值,斜率误差<100纳弧度均方根值。几个实验室使用各种仪器对三个具有挑战性的X射线光学元件进行了测量。这些反射镜被选来挑战和探索光学计量的不同方面,具体如下:一个1米长的超平反射镜(曲率半径R>100千米);一个添加了抛物线段的椭圆反射镜;以及一个添加了空间变化啁啾的强弯曲球面反射镜(R ∼ 9.3米)。这项研究突出了几种仪器的校准问题,随后对这些问题进行了校正。在本文中,我们展示了关于椭圆反射镜的测量结果。基于合作项目提供的计量数据,经过两个离子束修形周期,反射镜的各个方面都得到了改善,包括校正椭圆参数、减少高频和中频空间抛光误差以及优化抛物线段的形状。总体而言,斜率和高度误差提高了约10倍。我们还展示了循环测量练习如何有助于完善光学元件安装、对准以及数据采集和分析方法的“最佳实践”程序。希望这个合作项目将推动X射线光学元件生产质量的进一步提高,从而造福全球众多科学界。