Lian Yi, Liu Yongqi, Cheng Dewen, Chi Cheng, Bao Yanjun, Wang Yongtian
State Key Laboratory of Chips and Systems for Advanced Light Field Display, School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China.
Beijing Engineering Research Center of Mixed Reality and Advanced Display, School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China.
Nanophotonics. 2025 Aug 6;14(18):3053-3062. doi: 10.1515/nanoph-2025-0245. eCollection 2025 Sep.
Transport-of-intensity equation (TIE) as a noninterference method for quantitative phase imaging (QPI) has broad applications in micrographic imaging and optical metrology. Previous TIE-based QPI systems require the axial displacement of the detector to capture the axial intensity distributions, thus limiting the systems' response speed, integration, and phase retrieval accuracy. Besides, the TIE-based phase imaging for edge positions with large phase gradients remains challenging. In this work, a compact polarization-multiplexed Moiré metalens is proposed to achieve QPI and edge-enhanced imaging for high-precision and unwrapping phase imaging. This Moiré metalens enables continuous zooming from 58.7 μm to 61.8 μm, allowing flexible selection of the detection positions. Under -polarization light incidence, the metalens can achieve phase retrieval based on the TIE method, with the Root Mean Square Errors (RMSE) reaching 0.015 rad. Under -polarization light incidence, the metalens realizes varifocal edge-enhanced imaging for amplitude and phase objects, with a minimum spatial resolution of 1.3 μm. This Moiré metalens opens a new avenue to develop compact, integrated, and multifunctional phase imaging devices and has potential applications in optical detection, microscopy, and biomedical imaging.
强度传输方程(TIE)作为一种用于定量相位成像(QPI)的非干涉方法,在显微成像和光学计量学中有着广泛的应用。以往基于TIE的QPI系统需要探测器进行轴向位移来捕获轴向强度分布,从而限制了系统的响应速度、积分和相位检索精度。此外,对于具有大相位梯度的边缘位置,基于TIE的相位成像仍然具有挑战性。在这项工作中,提出了一种紧凑的偏振复用莫尔超表面透镜,以实现高精度和去包裹相位成像的QPI和边缘增强成像。这种莫尔超表面透镜能够在58.7μm至61.8μm范围内连续变焦,允许灵活选择检测位置。在偏振光入射下,该超表面透镜可以基于TIE方法实现相位检索,均方根误差(RMSE)达到0.015rad。在偏振光入射下,该超表面透镜实现了对振幅和相位物体的变焦边缘增强成像,最小空间分辨率为1.3μm。这种莫尔超表面透镜为开发紧凑、集成和多功能相位成像设备开辟了一条新途径,并在光学检测、显微镜和生物医学成像中具有潜在应用。