Simple stereoscan stage modification to allow the mounting of large specimens.
作者信息
Griffin N S
出版信息
J Phys E. 1973 Mar;6(3):207-8. doi: 10.1088/0022-3735/6/3/006.
PMID:4688323
Abstract
摘要
相似文献
1
Simple stereoscan stage modification to allow the mounting of large specimens.简单的立体扫描平台改装，以允许安装大型标本。
J Phys E. 1973 Mar;6(3):207-8. doi: 10.1088/0022-3735/6/3/006.
2
A simple double tilt modification of a stereoscan specimen stage.对立体扫描样品台的一种简单的双倾斜改进。
J Phys E. 1975 Oct;8(10):813-4. doi: 10.1088/0022-3735/8/10/006.
3
Modification of a scanning transmission electron microscope specimen holder for large section viewing.用于大切片观察的扫描透射电子显微镜样品台的改进。
Stain Technol. 1979 Mar;54(2):85-7. doi: 10.3109/10520297909112639.
4
Specimen discs for large-scale handling of preparations used in scanning electron microscopy.
Stain Technol. 1972 Jul;47(4):214-5. doi: 10.3109/10520297209116490.
5
A simple method for environmental cell depressurization for use with an electron microscope.一种用于电子显微镜的环境细胞减压的简单方法。
Microscopy (Oxf). 2017 Dec 1;66(6):424-430. doi: 10.1093/jmicro/dfx029.
6
Direct grounding tool for examination of uncoated specimens in the scanning electron microscope.用于在扫描电子显微镜中检查未镀膜标本的直接接地工具。
Rev Sci Instrum. 1979 Oct;50(10):1314-6. doi: 10.1063/1.1135675.
7
Specimen chambers for critical point drying for scanning electron microscopy.用于扫描电子显微镜临界点干燥的样品腔。
J Electron Microsc Tech. 1988 Apr;8(4):443-4. doi: 10.1002/jemt.1060080413.
8
Removal of sputtered gold from specimens after scanning electron microscope examination.扫描电子显微镜检查后从标本上去除溅射金。
Anal Biochem. 2004 Jun 1;329(1):154-6. doi: 10.1016/j.ab.2004.02.022.
9
A scanning electron microscopy specimen holder for viewing different angles of a single specimen.用于观察单个样本不同角度的扫描电子显微镜标本台。
Microsc Res Tech. 2010 Dec;73(12):1073-6. doi: 10.1002/jemt.20835.
10
Scanning Electron Microscopy (SEM) Methods for Dental Enamel.牙釉质的扫描电子显微镜（SEM）方法
Methods Mol Biol. 2019;1922:293-308. doi: 10.1007/978-1-4939-9012-2_27.
Zotero 插件