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通过对基底细胞层进行简单的形态计量学评估来鉴别各种上皮。镍作业工人假复层、化生和发育异常鼻上皮的光学显微镜分析。

Discrimination of various epithelia by simple morphometric evaluation of the basal cell layer. A light microscopic analysis of pseudostratified, metaplastic and dysplastic nasal epithelium in nickel workers.

作者信息

Boysen M, Reith A

出版信息

Virchows Arch B Cell Pathol Incl Mol Pathol. 1983;42(2):173-84. doi: 10.1007/BF02890380.

Abstract

This study presents a simple morphometric method for objective classification of pseudostratified, various types of metaplastic, and dysplastic epithelium by evaluation of cellular features in the basal layer only. Fifty-four biopsy specimens were taken for diagnostic reasons from the nasal mucosa of nickel workers, and semithin toluidine-blue-stained sections were analysed. The most sensitive parameters in distinguishing between the various types of epithelium were: (i) the transverse nuclear diameter, (ii) the size of the nucleoli and (iii) the basal cell width expressed as an index weighted towards the cell profiles with the broadest attachment face on the basal lamina. A combination of these three parameters allows a clear separation between dysplastic, metaplastic and pseudostratified epithelium. The sequential increase in these parameters from pseudostratified epithelium through two histologically distinguishable stages of metaplasia (stratified cuboidal and mixed stratified cuboidal/stratified squamous epithelium) to fully developed squamous epithelium supports the concept that metaplasia develops gradually. The continuous increase in these parameters from metaplasia to dysplasia further suggests that metaplasia is a necessary step in the development of nasal epithelial dysplasia. This morphometric model appears especially useful in monitoring small sequential epithelial changes, and might also be used for evaluating other types of epithelia.

摘要

本研究提出了一种简单的形态测量方法,仅通过评估基底层的细胞特征,对假复层、各种类型化生及发育异常的上皮进行客观分类。因诊断需要,从镍作业工人的鼻黏膜采集了54份活检标本,并对半薄甲苯胺蓝染色切片进行分析。区分不同类型上皮最敏感的参数为:(i)细胞核横向直径,(ii)核仁大小,(iii)基底细胞宽度,以在基膜上附着面最宽的细胞轮廓为权重计算指数。这三个参数的组合能清晰区分发育异常、化生及假复层上皮。这些参数从假复层上皮经化生的两个组织学可区分阶段(复层立方上皮及混合性复层立方/复层鳞状上皮)到完全发育的鳞状上皮依次增加,支持化生逐渐发展的概念。这些参数从化生到发育异常持续增加,进一步表明化生是鼻上皮发育异常发展的必要步骤。这种形态测量模型在监测上皮的小的连续变化方面似乎特别有用,也可用于评估其他类型的上皮。

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