Wickham M G, Rudolph R, Abraham J L
Science. 1978 Jan 27;199(4327):437-9. doi: 10.1126/science.619466.
The use of correlated microscopic techniques, including the scanning electron microscopic modes of backscattered electron imaging and energy dispersive x-ray analysis, aid in defining the process of dispersion of silicon-containing material around silicone rubber (polydimethylsiloxane) prosthetic devices.
相关显微镜技术的应用,包括背散射电子成像和能量色散X射线分析的扫描电子显微镜模式,有助于确定含硅材料在硅橡胶(聚二甲基硅氧烷)假体装置周围的分散过程。