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脑氧中毒发展过程中脑葡萄糖利用与皮层电活动的相关性

Correlation of brain glucose utilization and cortical electrical activity during development of brain oxygen toxicity.

作者信息

Torbati D, Greenberg J, Lambertsen C J

出版信息

Brain Res. 1983 Mar 7;262(2):267-73. doi: 10.1016/0006-8993(83)91017-x.

DOI:10.1016/0006-8993(83)91017-x
PMID:6301635
Abstract

Central nervous system (CNS) oxygen toxicity in rats is characterized by the appearance of alterations in electrical cortical activity (ECoG), followed by the appearance of paroxysmal electrical discharges and finally the onset of clinical convulsions. The correlation between the changes in ECoG and the regional cerebral metabolic rate for glucose (rCMRgl) during progressive oxygen toxicity was studied. Cortical electrodes for ECoG recording and venal arterial cannula for autoradiographic measurement of rCMRgl were chronically implanted. Using [14C]2-deoxyglucose (2-DG), the rCMRgl was measured in conscious unrestrained rats during different periods of exposure to 5 atmospheres absolute oxygen as well as an equivalent normoxic high pressure, while ECoG was continuously recorded and analyzed. A statistically significant increase in rCMRgl in 13 out of 24 investigated brain structures was found during the pre-paroxysmal electrical discharge period. This increase was accompanied by an elevation in slow and a reduction in fast ECoG frequency bands. The largest increase in rCMRgl was found in cerebellar and cerebral cortices, limbic, auditory and visual structures. Following the appearance of the first paroxysmal electrical discharge (FED) some limbic structures and cerebellar cortex showed further increases in rCMRgl, while several auditory and visual structures exhibited a significant decrease. Five atmospheres normoxic pressure had no effect on rCMRgl in any of the brain structures examined. It is concluded that pre-paroxysmal electrical discharge ECoG changes and the onset of the FED during progressive oxygen toxicity are not due to inhibition of brain energy metabolism. The possible mechanisms leading to alterations in rCMRgl during hyperbaric oxygenation are discussed.

摘要

大鼠中枢神经系统(CNS)氧中毒的特征是皮层电活动(ECoG)出现改变,随后出现阵发性放电,最终出现临床惊厥。研究了渐进性氧中毒期间ECoG变化与局部脑葡萄糖代谢率(rCMRgl)之间的相关性。长期植入用于记录ECoG的皮层电极和用于放射自显影测量rCMRgl的颈静脉动脉插管。使用[14C]2-脱氧葡萄糖(2-DG),在清醒自由活动的大鼠暴露于5个绝对大气压氧气以及等效的常氧高压的不同时间段内测量rCMRgl,同时持续记录和分析ECoG。在24个研究的脑结构中的13个中,在阵发性放电前期发现rCMRgl有统计学意义的增加。这种增加伴随着ECoG慢频段升高和快频段降低。rCMRgl增加最大的是小脑和大脑皮层、边缘系统、听觉和视觉结构。在首次阵发性放电(FED)出现后,一些边缘系统结构和小脑皮层的rCMRgl进一步增加,而一些听觉和视觉结构则显著下降。5个大气压的常氧压力对所检查的任何脑结构中的rCMRgl均无影响。得出的结论是,渐进性氧中毒期间阵发性放电前期的ECoG变化和FED的发作并非由于脑能量代谢受抑制。讨论了高压氧合期间导致rCMRgl改变的可能机制。

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引用本文的文献

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The determination of the local cerebral glucose utilization with the 2-deoxyglucose method.用2-脱氧葡萄糖法测定局部脑葡萄糖利用率。
Histochemistry. 1988;90(2):109-21. doi: 10.1007/BF00500975.