采用气体喷射等离子体源的闪光X射线显微镜术。
Flash X-ray microscopy with a gas jet plasma source.
作者信息
Feder R, Pearlman J S, Riordan J C, Costa J L
出版信息
J Microsc. 1984 Sep;135(Pt 3):347-51. doi: 10.1111/j.1365-2818.1984.tb02539.x.
Abstract
A novel flash X-ray source, the gas jet plasma source, has been used for contact X-ray microscopy. Using a wavelength range of 2-7 nm a resolution of the order of 30 nm can be obtained. The gas jet plasma source provides a new and unique tool which should allow future imaging of wet live cells.
摘要
一种新型的闪光X射线源——气体喷射等离子体源，已被用于接触式X射线显微镜检查。使用2 - 7纳米的波长范围，可以获得约30纳米的分辨率。气体喷射等离子体源提供了一种全新且独特的工具，有望实现对活体细胞的湿式成像。
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