Auer R N, Wieloch T, Olsson Y, Siesjö B K
Acta Neuropathol. 1984;64(3):177-91. doi: 10.1007/BF00688108.
Rats were exposed to insulin-induced hypoglycemia resulting in periods of cerebral isoelectricity ranging from 10 to 60 min. After recovery with glucose, they were allowed to wake up and survive for 1 week. Control rats were recovered at the stage of EEG slowing. After sub-serial sectioning, the number and distribution of dying neurons was assessed in each brain region. Acid fuchsin was found to stain moribund neurons a brilliant red. Brains from control rats showed no dying neurons. From 10 to 60 min of cerebral isoelectricity, the number of dying neurons per brain correlated positively with the number of minutes of cerebral isoelectricity up to the maximum examined period of 60 min. Neuronal necrosis was found in the major brain regions vulnerable to several different insults. However, within each region the damage was not distributed as observed in ischemia. A superficial to deep gradient in the density of neuronal necrosis was seen in the cerebral cortex. More severe damage revealed a gradient in relation to the subjacent white matter as well. The caudatoputamen was involved more heavily near the white matter, and in more severely affected animals near the angle of the lateral ventricle. The hippocampus showed dense neuronal necrosis at the crest of the dentate gyrus and a gradient of increasing selective neuronal necrosis medially in CA1. The CA3 zone, while relatively resistant, showed neuronal necrosis in relation to the lateral ventricle in animals with hydrocephalus. Sharp demarcations between normal and damaged neuropil were found in the hippocampus. The periventricular amygdaloid nuclei showed damage closest to the lateral ventricles. The cerebellum was affected first near the foramina of Luschka, with damage occurring over the hemispheres in more severely affected animals. Purkinje cells were affected first, but basket cells were damaged as well. Rare necrotic neurons were seen in brain stem nuclei. The spinal cord showed necrosis of neurons in all areas of the gray matter. Infarction was not seen in this study. The possibility is discussed that a neurotoxic substance borne in the tissue fluid and cerebrospinal fluid (CSF) contributes to the pathogenesis of neuronal necrosis in hypoglycemic brain damage.
将大鼠暴露于胰岛素诱导的低血糖环境中,导致脑电静止期持续10至60分钟。用葡萄糖恢复后,让它们苏醒并存活1周。对照大鼠在脑电图减慢阶段恢复。经过连续切片后,评估每个脑区中死亡神经元的数量和分布。发现酸性品红可将濒死神经元染成鲜红色。对照大鼠的大脑未显示死亡神经元。在长达60分钟的最大检测时间段内,脑电静止10至60分钟时,每个大脑中死亡神经元的数量与脑电静止的分钟数呈正相关。在易受几种不同损伤的主要脑区发现了神经元坏死。然而,在每个区域内,损伤的分布与缺血时观察到的情况不同。在大脑皮层可见神经元坏死密度从浅到深的梯度变化。更严重的损伤在与下方白质的关系上也显示出梯度变化。尾状核在白质附近受累更严重,在更严重受影响的动物中,靠近侧脑室角处也更严重。海马体在齿状回嵴处显示密集的神经元坏死,在CA1区内侧有选择性神经元坏死增加的梯度变化。CA3区虽然相对耐受,但在脑积水动物中,与侧脑室相关处显示神经元坏死。在海马体中发现正常神经纤维网与受损神经纤维网之间有明显界限。室周杏仁核在最靠近侧脑室处显示损伤。小脑首先在Luschka孔附近受到影响,在更严重受影响的动物中,半球也出现损伤。浦肯野细胞首先受到影响,但篮状细胞也受损。在脑干核中可见罕见的坏死神经元。脊髓灰质所有区域均显示神经元坏死。本研究未观察到梗死。讨论了组织液和脑脊液(CSF)中携带的神经毒性物质促成低血糖脑损伤中神经元坏死发病机制的可能性。