Van Pelt J, Verwer R W
J Microsc. 1984 Oct;136(Pt 1):23-34. doi: 10.1111/j.1365-2818.1984.tb02543.x.
Binary branching patterns are described in this paper by their topological structure. The statistical properties of these structures appear to be highly dependent on their growth patterns. As such, observed trees may be used for testing growth models. This paper describes three options in the construction of frequency distributions of topological parameters and their corresponding probability distributions, arising from the terminal and segmental growth models. The construction of these distributions makes the analysis of observed tree structures possible in those experimental conditions where small numbers of observations or differing sizes of trees would form serious obstacles to alternative analytical procedures.
本文通过拓扑结构描述二叉分支模式。这些结构的统计特性似乎高度依赖于它们的生长模式。因此，观察到的树可用于测试生长模型。本文描述了由终端和节段生长模型产生的拓扑参数频率分布及其相应概率分布构建中的三种选择。这些分布的构建使得在那些少量观测值或树木大小不同会对替代分析程序构成严重障碍的实验条件下，对观察到的树结构进行分析成为可能。
