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DNA结构:来自电子显微镜的证据。

DNA structure: evidence from electron microscopy.

作者信息

Griffith J D

出版信息

Science. 1978 Aug 11;201(4355):525-7. doi: 10.1126/science.663672.

Abstract

The contour lengths of phiX174 DNA duplex and RNA-DNA hybrid molecules were measured by several commonly used electron microscopic techniques. The countour length of the hybrid molecules corresponds to a rise of 2.5 to 2.6 angstroms per base pair, as expected for the A conformation, while the length of phiX174 duplex DNA similarly measured corresponds to a 2.9-angstrom rise, very different from 3.4 angstroms of the classic B form. Thus any chromatin structure parameter based on electron microscopy and a rise of 3.4 angstroms must be reappraised. The possibility that DNA in dilute solution also has a rise of 2.9 angstroms and a screw of 10.5 base pairs per turn is discussed.

摘要

通过几种常用的电子显微镜技术测量了φX174 DNA双链体和RNA-DNA杂交分子的轮廓长度。杂交分子的轮廓长度对应于每个碱基对上升2.5至2.6埃,这与A构象预期的一致,而以类似方式测量的φX174双链DNA的长度对应于2.9埃的上升,与经典B型的3.4埃非常不同。因此,任何基于电子显微镜和3.4埃上升的染色质结构参数都必须重新评估。文中讨论了在稀溶液中的DNA也具有2.9埃的上升和每圈10.5个碱基对的螺旋的可能性。

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