Kodera Y, Schmidt R A, Chan H P, Doi K
Radiology. 1984 Jan;150(1):231-4. doi: 10.1148/radiology.150.1.6689765.
Backscatter from four commonly used metals (aluminum, lead, copper, and iron) was measured under diagnostic imaging conditions, using screen-film systems as detectors. The results indicate that for an 80-kV filtered beam and Par Speed/XRP system, backscatter increases as aluminum (Al) thickness increases until it reaches a plateau of approximately 12% at 50 mm Al. The amount of backscatter from any of these four metals increases as the tube voltage is raised from 60 to 115 kV. Measured backscatter depends strongly on the screens used, possibly due to their attenuation and energy response. Backscatter from aluminum was significantly greater than that from the other metals tested.
在诊断成像条件下，使用增感屏 - 胶片系统作为探测器，测量了四种常用金属（铝、铅、铜和铁）的反向散射。结果表明，对于80 kV的过滤光束和标准速度/乳腺摄影系统，随着铝（Al）厚度增加，反向散射增加，直到在50 mm铝处达到约12%的平稳状态。当管电压从60 kV提高到115 kV时，这四种金属中任何一种的反向散射量都会增加。测量的反向散射强烈依赖于所使用的增感屏，这可能是由于它们的衰减和能量响应。铝的反向散射明显大于测试的其他金属。
