Gould R G, Judy P F, Bjärngard B E
Med Phys. 1978 Mar-Apr;5(2):115-9. doi: 10.1118/1.594470.
The noise performance of an experimental microchannel plate x-ray image intensifier has been evaluated. The intensifier, constructed for use with photons of energies between 20 and 150 keV, uses an MCP as the photon-to-electron converter. The influence of noise was determined by analysis of the optical-density fluctuations of a photograph of the viewing screen of the intensifier when the conversion layer was exposed to between 1 and 60 mR. Additionally, the contrast-detail performance of the experimental device was determined. The influence of both stochastic noise, due to quantum mottle and pulse-height variations, and structural noise, due to fluctuations in inherent gain from point to point, have been considered by using a model that adds these components.
对一种实验性微通道板X射线图像增强器的噪声性能进行了评估。该增强器是为与能量在20至150keV之间的光子配合使用而构建的，它使用微通道板作为光子到电子的转换器。当转换层暴露于1至60mR时，通过分析增强器观察屏照片的光密度波动来确定噪声的影响。此外，还确定了该实验装置的对比度细节性能。通过使用一个将这些成分相加的模型，考虑了由量子斑点和脉冲高度变化引起的随机噪声以及由各点固有增益波动引起的结构噪声的影响。
