Planelles G, Moreau K, Anagnostopoulos T
Pflugers Arch. 1983 Jan;396(1):41-8. doi: 10.1007/BF00584696.
Published values of transepithelial potential differences (VTE) in the proximal tubule of Necturus vary from approximately 0 to approximately -15 mV. In view of this disparity, we reinvestigated VTE. Our measured VTE was on the average -1.0 mV in early convolutions and +0.6 mV in terminal proximal segments. In the course of this study, we considered five distinct causes of artifacts. 1) Tip and pre-tip potentials: their occurrence was minimized by using Ringer's filled microelectrodes. 2) Interstitial tip localizations: the position of the tip was ascertained by the shift in potential, resulting in response to peritubular perfusion with gluconate solutions. 3) Leaky impalements: VTE responses to gluconate, input resistance determinations and the presence of positive VTE's rule out the leak hypothesis. 4) Zeroline shifts between pre- and postimpalement stages, and 5) Spontaneous VTE drifts in the positive direction, due to gradual passage of the tip from cell to lumen, or in the negative direction, resulting from tip contact with the lower cellular layer. All five causes of artifacts may be involved in the controversy regarding past VTE estimates.
美西螈近端小管跨上皮电位差(VTE)的已发表值在约0至约 -15 mV之间变化。鉴于这种差异,我们重新研究了VTE。我们测得的VTE在早期盘曲段平均为 -1.0 mV,在近端终末段为 +0.6 mV。在本研究过程中,我们考虑了五种不同的假象原因。1)尖端和尖端前电位:通过使用充有林格液的微电极将其出现降至最低。2)间质尖端定位:通过电位变化确定尖端位置,这是对用葡萄糖酸盐溶液进行肾小管周围灌注的反应。3)穿刺渗漏:VTE对葡萄糖酸盐的反应、输入电阻测定以及正VTE的存在排除了渗漏假说。4)穿刺前和穿刺后阶段之间的零线偏移,以及5)由于尖端从细胞逐渐进入管腔导致VTE自发正向漂移,或由于尖端与下层细胞接触导致负向漂移。假象的所有这五个原因可能都与过去VTE估计值的争议有关。