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关于适合脆性X表达的培养条件诱导的端粒染色体变化频率。

On the frequency of telomeric chromosomal changes induced by culture conditions suitable for fragile X expression.

作者信息

Steinbach P, Barbi G, Böller T

出版信息

Hum Genet. 1982;61(2):160-2. doi: 10.1007/BF00274209.

Abstract

Under culture conditions suitable for the expression of the fragile site Xq27, "nonspecific" telomeric structural changes similar to the "specific" fra(X) formation occurred apparently on every chromosome arm. Significant differences between individuals seem to exist. The total frequency of nonspecific terminal lesions not located on the long arm of the X chromosome was 0.22 +/- 0.17 per cell in 37 cultures examined. If telomeric lesions on Xq occur in more than 0.7% of the cells from a single culture in males and more than 1.5% of the cells from a single culture in females, then this probably indicates a specific fra(X) expression. Lower percentages may be the result of nonspecific telomeric structural changes in q. These are expected to occur in the normal X as well and may, therefore, give rise to false positive diagnoses in the detection of hemi-, and hetero-, and perhaps also homozygous fra(X) carriers.

摘要

在适合脆性位点Xq27表达的培养条件下,与“特异性”fra(X)形成相似的“非特异性”端粒结构变化显然在每个染色体臂上都有发生。个体之间似乎存在显著差异。在所检测的37个培养物中,位于X染色体长臂以外的非特异性末端损伤的总频率为每个细胞0.22±0.17。如果男性单个培养物中超过0.7%的细胞以及女性单个培养物中超过1.5%的细胞出现Xq端粒损伤,那么这可能表明存在特异性fra(X)表达。较低的百分比可能是q中非特异性端粒结构变化的结果。这些变化预计也会在正常X染色体上出现,因此,在检测半合子、杂合子以及可能的纯合子fra(X)携带者时可能会导致假阳性诊断。

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