Katterwe H, Goebel R, Grooss K D
Scan Electron Microsc. 1982(Pt 2):499-504.
A brief historical view of the origin, development, and application of the light comparison microscope is given. Problems emanating from restricted depth of focus in light-microscopical techniques are eliminated by utilizing the scanning electron microscope. Various attempts have been made to use the scanning electron microscope suitable for comparison microscopy: videotape, image storage tube, split field scan. In 1980 another way of performing scanning electron comparison microscopy was contrived: the coupling of two instruments. Both instruments are equipped with several electron detection systems, which produce special contrast effects. For applications with the comparison scanning electron microscope in forensic science a number of interchangeable specimen holders, were designed.
