Hiramoto Y, Hamaguchi Y, Shôji Y, Shimoda S
J Cell Biol. 1981 Apr;89(1):115-20. doi: 10.1083/jcb.89.1.115.
A method of polarization optical analysis is described in which phase retardation attributable to birefringence of a minute area in a microscopic object is determined. The optical system consists of a polarizing microscope with "rectified" strain-free lenses, a photoelectric detector to determine the intensity of the light passing through a minute window located at the image plane of the specimen, and a stage that moves the specimen at appropriate velocities for scanning. The error resulting from any flare of light emerging from outside of the area to be measured is minimized by limiting the illuminated area. The specimen can be observed during the measurement of light intensity by illuminating the whole microscope field at a wavelength different from that of the light used for the measurement. The retardation of the specimen is determined by comparing the specimen and background intensities as functions of the azimuth of a Brace-Köherl compensator. Alternatively, retardation is obtained directly from the light intensity at a fixed compensator angle, using the theory of polarization optics. The basal noise level for the present apparatus is approximately 0.03 nm when measuring birefringence of a 4-micron2 area in 0.1 s, using a X 40, NA 0.65 objective. The noise decreases in inverse proportion to the square root of the area times the duration of measurement.
描述了一种偏振光学分析方法,该方法用于确定微观物体中微小区域的双折射所引起的相位延迟。光学系统由一台带有“校正”无应变透镜的偏振显微镜、一个用于确定通过位于样品像平面的微小窗口的光强度的光电探测器以及一个以适当速度移动样品进行扫描的载物台组成。通过限制照明区域,可将来自待测区域外部的任何杂散光所导致的误差降至最低。在测量光强度期间,可通过以与测量所用光不同的波长照亮整个显微镜视野来观察样品。通过比较样品和背景强度作为布雷斯 - 柯赫尔补偿器方位角的函数,来确定样品的相位延迟。或者,利用偏振光学理论,直接从固定补偿器角度下的光强度获得相位延迟。使用X40、NA 0.65物镜,在0.1秒内测量4平方微米区域的双折射时,本仪器的基本噪声水平约为0.03纳米。噪声与测量面积乘以测量持续时间的平方根成反比降低。