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成熟中枢突触终末参数的定量及其相互关系:实验研究的视角

Quantitation of terminal parameters and their inter-relationships in maturing central synapses: a perspective for experimental studies.

作者信息

Dyson S E, Jones D G

出版信息

Brain Res. 1980 Feb 3;183(1):43-59. doi: 10.1016/0006-8993(80)90118-3.

Abstract

The development and maturation of synapses in the molecular layer of the occipital cortex of rats at 15, 20, 28, 75 and 224 days postnatal were examined and quantitative ultrastructural techniques were employed. The parameters evaluated display a diverse set of trends. A steady increase in mean terminal area is noted, the proportions of the smallest terminals declining progressively over this period. The mean length of the postsynaptic thickening fluctuates throughout the developmental series. A close association is found between terminal area and junction lengthlarger junction lengths being consistently associated with larger areas. Synaptic vesicle numbers within each terminal increase markedly between 15 and 28 days. There is an increase in the frequency of flat and positively curved junctions with increasing age, the bimodal distribution of negative and positive curvatures at 15 days being replaced by a normal distribution in the adult. When synaptic length is compared with curvature, flat junctions emerge as the longest and the most highly curved junctions as the shortest. The terminal areas of positive junctions are greater than those of negative ones. The consequences of these results for the flat disc model of synapses are discussed, and it is postulated that negatively curved synaptic junctions may be non-functional.

摘要

对出生后15、20、28、75和224天的大鼠枕叶皮质分子层突触的发育和成熟进行了检查,并采用了定量超微结构技术。所评估的参数呈现出多种趋势。观察到平均终末面积稳步增加,在此期间最小终末的比例逐渐下降。突触后增厚的平均长度在整个发育系列中波动。发现终末面积与连接长度之间存在密切关联——较大的连接长度始终与较大的面积相关。每个终末内的突触小泡数量在15至28天之间显著增加。随着年龄增长,扁平及正弯曲连接的频率增加,15天时负曲率和正曲率的双峰分布在成年时被正态分布所取代。当比较突触长度与曲率时,扁平连接是最长的,而曲率最高的连接是最短的。正连接的终末面积大于负连接的终末面积。讨论了这些结果对突触扁平盘模型的影响,并推测负弯曲突触连接可能无功能。

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