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银锡合金与汞齐:电化学考量

Silver-tin alloys and amalgams: electrochemical considerations.

作者信息

Mueller H J

出版信息

Biomater Med Devices Artif Organs. 1980;8(1):59-87. doi: 10.3109/10731198009118973.

Abstract

The corrosion potential and anodic polarization profiles of a representative number of silver-tin alloys and their corresponding amalgams in a physiological solution were determined and compared to their microstructures. For the alloys with tin-content greater than 27%(wt) and for all amalgams, the corrosion process is related to the attack of free tin for the alloys and to the gamma-2 tin for the amalgams. The gamma-2 concentration in the amalgams increases with an increase in tin-content. For alloys with tin-content less than 27%, the corrosion process is even more restricted than for the process observed with pure silver. From a developed theory based upon the potential-time and polarization results, association of the O2 reduction process on a SnO cathodic film to an intermediate specie of H2O2 is made. The rate of H2O2 decomposition on a SnO surface in a four electron process is thought to control the O2 reduction overvoltage. The O2 reduction overvoltage decreases with increases in the silver-content of the amalgam, particularily seen with the 8 and 12% tin compositions. Due to the polarization induced corrosion process, a phase with high silver and high mercury concentrations was observed over the unreacted particles.

摘要

测定了一定数量具有代表性的银锡合金及其相应汞齐在生理溶液中的腐蚀电位和阳极极化曲线,并将其与微观结构进行了比较。对于锡含量大于27%(重量)的合金以及所有汞齐,腐蚀过程与合金中游离锡的侵蚀以及汞齐中γ-2锡的侵蚀有关。汞齐中γ-2的浓度随锡含量的增加而增加。对于锡含量小于27%的合金,腐蚀过程甚至比纯银所观察到的过程受到更多限制。基于电位-时间和极化结果发展出的一种理论认为,SnO阴极膜上的O₂还原过程与H₂O₂的中间物种有关。在四电子过程中,SnO表面上H₂O₂的分解速率被认为控制着O₂还原过电压。汞齐中银含量增加时,O₂还原过电压降低,在含8%和12%锡的组成中尤为明显。由于极化诱导的腐蚀过程,在未反应颗粒上观察到了高银和高汞浓度的相。

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