Electric field induced defect-forming mechanisms in lipid bilayers.

The role of structural defects in the ionic conduction properties of unmodified bimolecular lipid membranes (BLMs) is discussed. Two mechanisms of defect forming processes are considered: the compressive effect of the electric field on the membrane, and the field-induced bending of lipid polar head groups. It is shown that the dependence of conductivity on both concentration and temperature, as well as the dielectric stability of lipid membranes can be explained in the terms of either mechanism suggested.