van Marle J, Dietrich A, Jonges K, Jonges R, de Moor E, Vink A, Boon P, van Veen H
Department of Electron Microscopy, University of Amsterdam, The Netherlands.
Microsc Res Tech. 1995 Jul 1;31(4):311-6. doi: 10.1002/jemt.1070310409.
Using back projection for reconstruction and tilt series of Epon or Lowicryl embedded and sectioned material, we demonstrated: (1) a reduction in thickness of 50% for Epon and 80% for Lowicryl sections, and (2) a non-uniform density distribution along the electron-optical axis in sections. The highest density was found at the vacuum exposed side of the section. The formvar side of the section showed a similar increase in density, but not to the same extent. Minimalization of electron exposure, even without pre-exposure, did not affect the reconstructed thickness, nor did it affect the non-uniform density distribution. However, parallax measurements showed that at 150K, collapse of Epon sections does not take place. For EM-tomography of plastic embedded material our findings imply that at the top and bottom portion of the sections the dimensions of the reconstructed structures are distorted, but that in the middle portion the dimensions are reliably retained.
使用反投影法对环氧树脂(Epon)或低粘度丙烯酸树脂(Lowicryl)包埋和切片材料进行重建和倾斜系列处理,我们证明:(1)环氧树脂切片厚度减少50%,低粘度丙烯酸树脂切片厚度减少80%;(2)切片沿电子光学轴的密度分布不均匀。在切片暴露于真空的一侧发现密度最高。切片的福尔马膜(formvar)一侧密度也有类似增加,但程度不同。即使不进行预曝光,将电子曝光降至最低也不会影响重建厚度,也不会影响密度分布不均匀的情况。然而,视差测量表明,在150K时,环氧树脂切片不会发生塌陷。对于塑料包埋材料的电子断层扫描,我们的研究结果表明,在切片的顶部和底部,重建结构的尺寸会发生扭曲,但在中间部分,尺寸能够可靠保留。