Suppr超能文献

中国仓鼠卵巢细胞中热放射增敏作用与缓慢重新连接的DNA链断裂之间的相关性。

Correlation between thermal radiosensitization and slowly rejoined DNA strand breaks in CHO cells.

作者信息

Dikomey E, Jung H

机构信息

Institute of Biophysics and Radiobiology, University of Hamburg, Germany.

出版信息

Int J Radiat Biol. 1995 Sep;68(3):227-33. doi: 10.1080/09553009514551151.

Abstract

The effect on the repair of slowly rejoined strand breaks was studied in CHO cells using the alkaline unwinding technique. Heat (45 degrees C, 20 min) combined with a X-ray dose of 9 Gy was found to result in an increased half-time of repair but also in an increased number of slowly rejoined strand breaks. When a time interval at 37 degrees C was inserted between irradiation and heat, the half-time of repair was not altered, whereas the number of slowly rejoined strand breaks as measured 300 min after irradiation decreased with increasing time interval between the two treatments. The half-time of 18 +/- 2 min suggested that the additionally formed, slowly rejoined strand breaks arise from a certain type of radiation-induced DNA base lesions with repair of which is modified by heat. The effect of X-irradiation combined with heat was also studied for cell survival. When irradiation and heat were separated by an incubation at 37 degrees C, cell survival increased with a half-time of 20 +/- 2 min, which is similar to that measured for the number of additional, slowly rejoined strand breaks. For a great variety of combined treatments, the reduction in cell survival correlates well with the enhanced number of slowly rejoined strand breaks measured 300 min after irradiation. This positive correlation and the similarity in the half-times mentioned above suggests that thermal radiosensitization results from the number of additional, slowly rejoined strand breaks formed when irradiation was combined with heat.

摘要

利用碱性解旋技术在CHO细胞中研究了对缓慢重新连接的链断裂修复的影响。发现45℃、20分钟的加热与9 Gy的X射线剂量相结合会导致修复半衰期增加,但也会导致缓慢重新连接的链断裂数量增加。当在照射和加热之间插入37℃的时间间隔时,修复半衰期没有改变,而照射后300分钟测量的缓慢重新连接的链断裂数量随着两种处理之间时间间隔的增加而减少。18±2分钟的半衰期表明,额外形成的、缓慢重新连接的链断裂源自某种类型的辐射诱导的DNA碱基损伤,其修复受到加热的影响。还研究了X射线照射与加热相结合对细胞存活的影响。当照射和加热通过在37℃孵育分开时,细胞存活率以20±2分钟的半衰期增加,这与额外的、缓慢重新连接的链断裂数量的测量值相似。对于多种联合处理,细胞存活率的降低与照射后300分钟测量的缓慢重新连接的链断裂数量增加密切相关。这种正相关以及上述半衰期的相似性表明,热放射增敏作用源于照射与加热相结合时形成的额外的、缓慢重新连接的链断裂数量。

文献检索

告别复杂PubMed语法,用中文像聊天一样搜索,搜遍4000万医学文献。AI智能推荐,让科研检索更轻松。

立即免费搜索

文件翻译

保留排版,准确专业,支持PDF/Word/PPT等文件格式,支持 12+语言互译。

免费翻译文档

深度研究

AI帮你快速写综述,25分钟生成高质量综述,智能提取关键信息,辅助科研写作。

立即免费体验