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用于生物高分辨率扫描电子显微镜的高质量单原子铬膜分析。

Analysis of high quality monatomic chromium films used in biological high resolution scanning electron microscopy.

作者信息

Apkarian R P

机构信息

Yerkes Research Center, Emory University, Atlanta, GA 30322.

出版信息

Scanning Microsc. 1994;8(2):289-99; discussion 299-301.

PMID:7701300
Abstract

During the recent employment of field emission (FE) in-lens scanning electron microscopes (SEMs), refractory metal deposition technology has co-evolved to provide enhanced contrast of 1-10 nm hydrocarbon based biological structures imaged at high magnifications (> 200,000 times). Pioneer development employing the Penning sputter system in a high vacuum chamber proved that imaging of chromium (Cr) coated biological specimens contained enriched secondary electron (SE)-(I) contrasts. Single nanometer size fibrillar and particulate ectodomains within the context of complex biological membranes were accurately imaged without significant enlargement using the high resolution SE-I mode (HRSEM). This paper reports the transmission electron microscopy (TEM) testing of ultrathin (0.5-2.0 nm) Cr films deposited by planar magnetron sputter coating (PMSC). Essential parameters necessary to reproduce quality sputtered films of refractory metals used in HRSEM studies were described for the vacuum system and target operation conditions (current, voltage, and target distance). HRSEM imaging of biological specimens is presented to assess contrast attained from ultrathin fine grain Cr films deposited by PMSC. High magnification images were recorded to illustrate high quality contrasts attainable by HRSEM at low (1-5 kV) and high (10-30 kV) voltages. Dispersed molecules on formvar coated grids were sputter coated with a 1 nm thick Cr film before employing scanning transmission (STEM)/SEM modes of the FESEM to establish non-decorative image accuracy in the transmitted electron mode.

摘要

在近期场发射(FE)内透镜扫描电子显微镜(SEM)的应用过程中,难熔金属沉积技术也随之发展,以增强在高放大倍数(>200,000倍)下成像的1 - 10纳米碳氢化合物基生物结构的对比度。在高真空腔室中采用潘宁溅射系统的开创性开发证明,对涂覆铬(Cr)的生物标本成像时,包含丰富的二次电子(SE)-(I)对比度。在复杂生物膜环境中,单纳米尺寸的纤维状和颗粒状胞外区域在不显著放大的情况下,使用高分辨率SE - I模式(HRSEM)能够准确成像。本文报道了通过平面磁控溅射镀膜(PMSC)沉积的超薄(0.5 - 2.0纳米)Cr膜的透射电子显微镜(TEM)测试。针对真空系统和靶材操作条件(电流、电压和靶距),描述了在HRSEM研究中重现难熔金属高质量溅射膜所需的基本参数。展示了生物标本的HRSEM成像,以评估通过PMSC沉积的超薄细晶粒Cr膜获得的对比度。记录了高放大倍数图像,以说明HRSEM在低(1 - 5 kV)和高(10 - 30 kV)电压下可实现的高质量对比度。在采用场发射扫描电子显微镜(FESEM)的扫描透射(STEM)/SEM模式之前,先在福尔马膜覆盖的网格上对分散的分子溅射镀上1纳米厚的Cr膜,以确定透射电子模式下无修饰图像的准确性。

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