利用全反射X射线荧光对牙菌斑薄膜进行超微分析。

Ultramicroanalysis of dental plaque films by total reflection X-ray fluorescence.

作者信息

von Bohlen A, Rechmann P, Tourmann J L, Klockenkämper R

机构信息

Institut für Spektrochemie und angewandte Spektroskopie, Dortmund, Fed., Rep. of Germany.

出版信息

J Trace Elem Electrolytes Health Dis. 1994 Mar;8(1):37-42.

PMID:7804028

Abstract

Microgram quantities of dental plaque were taken near amalgam fillings, gold crowns and intact teeth. Such extremely small samples can be analysed by total reflection X-ray fluorescence (TXRF), a fairly new variant of energy dispersive X-ray fluorescence (EDXRF). More than sixty samples were examined directly without chemical pretreatment. Fifteen elements of interest were detected simultaneously within a wide range of mass fraction and with detection limits of several mg/kg. A significant correlation of the Hg-accumulation in plaque and the amalgam fillings was established. Near these fillings Hg mass fractions can reach a level of 300 mg/kg. The results for other elements, e.g. Au, are less significant.

摘要

在汞合金填充物、金冠和完好牙齿附近采集微克量的牙菌斑。如此微量的样本可通过全反射X射线荧光光谱法（TXRF）进行分析，这是能量色散X射线荧光光谱法（EDXRF）的一种较新变体。六十多个样本未经化学预处理直接进行了检测。在很宽的质量分数范围内同时检测到了十五种感兴趣的元素，检测限为几毫克/千克。牙菌斑中汞的积累与汞合金填充物之间建立了显著的相关性。在这些填充物附近，汞的质量分数可达300毫克/千克。其他元素（如金）的结果则不太显著。