Horino Y, Mokuno Y, Kinomura A, Fujii K, Yumoto S
Osaka National Research Institute, AIST (ONRI), Japan.
Scanning Microsc. 1993 Dec;7(4):1215-20.
Heavy ion microprobes (HIM) such as 3 MeV Si2+ and 3 MeV p2+ have been applied to the elemental analysis by PIXE (proton-induced X-ray emission). It was found that silicon and phosphorus microprobes have several times higher sensitivity for aluminum K alpha X-rays than 2 MeV proton microprobes, and detection limits were more favorable in a phosphorus microprobe. Using a 3 MeV P2+ microprobe, the liver of a rat, which had been injected with aluminum-lactate, was investigated and it was found that aluminum segregates in areas with a dimension of about 10 microns. These areas could hardly be observed with 2 MeV proton microprobes.
诸如3兆电子伏特的硅离子（Si2+）和3兆电子伏特的质子（p2+）等重离子微探针已被应用于质子激发X射线发射（PIXE）的元素分析。结果发现，硅和磷微探针对铝Kα X射线的灵敏度比2兆电子伏特的质子微探针高出几倍，并且磷微探针的检测限更有利。使用3兆电子伏特的质子（P2+）微探针，对注射了乳酸铝的大鼠肝脏进行了研究，发现铝聚集在尺寸约为10微米的区域。用2兆电子伏特的质子微探针几乎观察不到这些区域。
