Deslattes R D, Levin J C, Walker M D, Henins A
National Institute of Standards and Technology, Gaithersburg, Maryland 20899.
Med Phys. 1994 Jan;21(1):123-6. doi: 10.1118/1.597243.
Wavelength dispersive crystal diffraction spectrometry has been applied to the measurement of the accelerating voltage on an x-ray source in a prototype experiment in the mammographic source. The results indicate that this noninvasive approach can yield determinations of such voltages within 0.1 kV, a level of imprecision that appears adequate for high-level standardization of such potentials.
波长色散晶体衍射光谱法已应用于乳腺摄影源原型实验中对X射线源加速电压的测量。结果表明，这种非侵入性方法能够在0.1 kV范围内测定此类电压，这种不精确程度对于此类电位的高水平标准化而言似乎是足够的。
