Chantler C T, Deslattes R D, Henins A, Hudson L T
School of Physics, University of Melbourne, Parkville, Victoria, Australia.
Br J Radiol. 1996 Jul;69(823):636-49. doi: 10.1259/0007-1285-69-823-636.
The demand for improved spectral understanding of mammographic X-ray sources and non-invasive voltage calibration of such sources has led to research into applications using curved crystal spectroscopy. Recent developments and the promise of improved precision and control are described. Analytical equations are presented to indicate effects of errors and alignment problems in the flat and curved crystal systems. These are appropriate for all detection systems. Application to and testing of spectrographic detection (using standard X-ray film) is presented. Suitable arrangements exist which can be used to measure X-ray tube voltages well below 1 kV precision in the operating range of 20-35 kV.
对乳腺X射线源的光谱理解进行改进以及对此类源进行非侵入式电压校准的需求，引发了对使用弯曲晶体光谱学应用的研究。文中描述了最新进展以及提高精度和控制的前景。给出了解析方程，以表明平板晶体系统和弯曲晶体系统中误差及对准问题的影响。这些方程适用于所有检测系统。文中介绍了光谱检测（使用标准X射线胶片）的应用和测试。存在合适的装置，可用于在20 - 35 kV的工作范围内精确测量远低于1 kV的X射线管电压。
