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大肠杆菌中直接重复序列间缺失和重复过程中一级和二级DNA结构的影响

The influence of primary and secondary DNA structure in deletion and duplication between direct repeats in Escherichia coli.

作者信息

Trinh T Q, Sinden R R

机构信息

Department of and Molecular Genetics, Biochemistry, and Microbiology, University of Cincinnati College of Medicine, Ohio 45267-0524.

出版信息

Genetics. 1993 Jun;134(2):409-22. doi: 10.1093/genetics/134.2.409.

Abstract

We describe a system to measure the frequency of both deletions and duplications between direct repeats. Short 17- and 18-bp palindromic and nonpalindromic DNA sequences were cloned into the EcoRI site within the chloramphenicol acetyltransferase gene of plasmids pBR325 and pJT7. This creates an insert between direct repeated EcoRI sites and results in a chloramphenicol-sensitive phenotype. Selection for chloramphenicol resistance was utilized to select chloramphenicol resistant revertants that included those with precise deletion of the insert from plasmid pBR325 and duplication of the insert in plasmid pJT7. The frequency of deletion or duplication varied more than 500-fold depending on the sequence of the short sequence inserted into the EcoRI site. For the nonpalindromic inserts, multiple internal direct repeats and the length of the direct repeats appear to influence the frequency of deletion. Certain palindromic DNA sequences with the potential to form DNA hairpin structures that might stabilize the misalignment of direct repeats had a high frequency of deletion. Other DNA sequences with the potential to form structures that might destabilize misalignment of direct repeats had a very low frequency of deletion. Duplication mutations occurred at the highest frequency when the DNA between the direct repeats contained no direct or inverted repeats. The presence of inverted repeats dramatically reduced the frequency of duplications. The results support the slippage-misalignment model, suggesting that misalignment occurring during DNA replication leads to deletion and duplication mutations. The results also support the idea that the formation of DNA secondary structures during DNA replication can facilitate and direct specific mutagenic events.

摘要

我们描述了一种用于测量直接重复序列之间缺失和重复频率的系统。将短的17和18个碱基对的回文和非回文DNA序列克隆到质粒pBR325和pJT7的氯霉素乙酰转移酶基因内的EcoRI位点。这在直接重复的EcoRI位点之间产生一个插入片段,并导致氯霉素敏感表型。利用对氯霉素抗性的选择来筛选氯霉素抗性回复突变体,其中包括那些从质粒pBR325中精确缺失插入片段以及在质粒pJT7中重复插入片段的突变体。缺失或重复的频率根据插入到EcoRI位点的短序列的不同而变化超过500倍。对于非回文插入片段,多个内部直接重复序列和直接重复序列的长度似乎会影响缺失频率。某些具有形成可能稳定直接重复序列错配的DNA发夹结构潜力的回文DNA序列具有较高的缺失频率。其他具有形成可能破坏直接重复序列错配稳定性的结构潜力的DNA序列则具有非常低的缺失频率。当直接重复序列之间的DNA不包含直接或反向重复序列时,重复突变发生的频率最高。反向重复序列的存在显著降低了重复的频率。这些结果支持滑动错配模型,表明DNA复制过程中发生的错配会导致缺失和重复突变。这些结果还支持这样一种观点,即DNA复制过程中DNA二级结构的形成可以促进和指导特定的诱变事件。

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