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通过比较三次头影测量叠加的数据来划分上颌牙齿位移的组成部分。

Partitioning the components of maxillary tooth displacement by the comparison of data from three cephalometric superimpositions.

作者信息

Baumrind S, Ben-Bassat Y, Bravo L A, Curry S, Korn E L

机构信息

Department of Growth and Development, School of Dentistry, University of California, San Francisco 94143, USA.

出版信息

Angle Orthod. 1996;66(2):111-24. doi: 10.1043/0003-3219(1996)066<0111:PTCOMT>2.3.CO;2.

Abstract

Using roentgenographic cephalograms from a sample of subjects with metallic implants, appropriately superimposed tracings were used to distinguish developmental and treatment-associated displacements of the maxillary central incisor and first molar associated "local" changes within the periodontium from "secondary" changes which reflect sutural and appositional growth at more distant osseous loci. Tracings were superimposed on anterior cranial base (ACB), on the maxillary implants only (IMP_MAX), and according to the best fit of maxillary anatomic structures without reference to the implants (A_MAX). Using the IMP_MAX superimposition, one could measure total local displacement at any landmark taking into consideration the effects of all appositional and resorptive changes on the superior and anterior surfaces of the palate, whereas using the A_MAX superimposition one could measure local displacement without consideration of surface appositional and resorptive changes. If the second of these measurements were subtracted from the first, the result would be a direct measurement of the effects of surface appositional and resorptive changes as they are expressed at that particular landmark. This strategy has enabled us to quantify and report the amount of accommodation which occurs at the location of each dental landmark in association with the resorptive and appositional changes which occur through time on the superior and anterior surfaces of the hard palate.

摘要

利用一组有金属植入物的受试者的X线头颅侧位片,通过适当叠加的描迹来区分上颌中切牙和第一磨牙的发育性移位以及与治疗相关的移位,以及牙周组织内的“局部”变化与反映更远骨位点缝合和附加生长的“继发性”变化。描迹分别叠加在前颅底(ACB)、仅上颌植入物(IMP_MAX)上,以及根据上颌解剖结构的最佳拟合且不参考植入物(A_MAX)进行叠加。使用IMP_MAX叠加,可以测量任何标志点的总局部位移,同时考虑到腭部上表面和前表面所有附加和吸收性变化的影响;而使用A_MAX叠加,可以测量不考虑表面附加和吸收性变化的局部位移。如果从第一个测量值中减去第二个测量值,结果将是表面附加和吸收性变化在该特定标志点所表现出的影响的直接测量值。这种策略使我们能够量化并报告与硬腭上表面和前表面随时间发生的吸收和附加变化相关的每个牙齿标志点位置处发生的适应性变化量。

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