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含重原子有机结构的精确电子晶体学精修。

The accurate electron crystallographic refinement of organic structures containing heavy atoms.

作者信息

Dorset D L

机构信息

Electron Diffraction Department, Hauptman-Woodward Medical Research Institute, Inc., Buffalo, New York 14203-1196, USA.

出版信息

Acta Crystallogr A. 1997 May 1;53 ( Pt 3):356-65. doi: 10.1107/s0108767397000536.

DOI:10.1107/s0108767397000536
PMID:9175261
Abstract

Prospects for the accurate structure determination of heavy-atom-containing organic crystals were evaluated with electron diffraction data from perchloro and perbromo derivatives of copper phthalocyanine. While the extensive overlap of experimental Patterson maps (from 1200kV intensities) with respective crystal autocorrelation functions explains the success of previous direct structure analyses, it is clear that multiple-scattering perturbations still evident at high voltage will frustrate the determination of accurate bond distances and angles. If, however, the result obtained after direct structure analysis and Fourier refinement is used to position an idealized molecular model (i.e. with chemically reasonable bonding parameters), the correct structure can then be justified by a rotational search coupled with a multislice dynamical calculation. Even though dynamical scattering is not the only major perturbation to such data sets, the resolution-limited correction is still sufficient to identify the correct molecular orientation in the unit cell. Alternatively, an acceptable unconstrained structure refinement can be carried out via a procedure proposed by Huang, Liu, Gu, Xiong, Fan & Li [Acta Cryst. (1996), A52, 152-157]. A phenomenological adjustment of observed intensities, based initially on the heavy-atom positions found in a high-resolution electron micrograph, will permit all light atoms to be observed near their ideal positions in the ensuing Fourier refinement.

摘要

利用酞菁铜的全氯和全溴衍生物的电子衍射数据,评估了含重原子有机晶体精确结构测定的前景。虽然实验帕特森图(来自1200kV强度)与各自的晶体自相关函数的广泛重叠解释了先前直接结构分析的成功,但很明显,在高电压下仍然明显的多重散射扰动将阻碍精确键长和键角的测定。然而,如果将直接结构分析和傅里叶精修后得到的结果用于定位理想化的分子模型(即具有化学合理的键合参数),那么通过旋转搜索结合多层动态计算可以验证正确的结构。尽管动态散射不是此类数据集的唯一主要扰动,但分辨率受限的校正仍然足以识别晶胞中正确的分子取向。或者,可以通过Huang、Liu、Gu、Xiong、Fan和Li [《晶体学报》(1996年),A52,152 - 157]提出的程序进行可接受的无约束结构精修。基于在高分辨率电子显微镜中发现的重原子位置,对观察到的强度进行唯象调整,将使所有轻原子在随后的傅里叶精修中在其理想位置附近被观察到。

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