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一种用于反相气相色谱法评估表面纳米粗糙度的分子探针的新拓扑指数。

A New Topological Index for Molecular Probes Used in Inverse Gas Chromatography for the Surface Nanorugosity Evaluation.

作者信息

Brendlé E, Papirer E

机构信息

Institut de Chimie des Surfaces et Interfaces (CNRS), Mulhouse Cedex, F-68057, France

出版信息

J Colloid Interface Sci. 1997 Oct 1;194(1):207-16. doi: 10.1006/jcis.1997.5104.

Abstract

Inverse gas chromatography is currently used for the determination of the surface properties of divided solids by probing the surface with alkanes or polar molecules of known properties. This paper suggests the use of a new topological index for the description of the probe's (alkanes) geometry and hence of their accessibility to the solid's surface. The proposed index (chiT) derives from the well known Wiener index. The application of chiT for the determination of the dispersive component of the surface energy of pyrogenic silica, but also for the evaluation of the geometric heterogeneity of lamellar silica, is described. Further, goethite and zirconia samples were submitted to similar analysis. Copyright 1997 Academic Press. Copyright 1997Academic Press

摘要

反相气相色谱法目前用于通过用已知性质的烷烃或极性分子探测表面来测定分散固体的表面性质。本文提出使用一种新的拓扑指数来描述探针(烷烃)的几何形状,从而描述它们与固体表面的可及性。所提出的指数(χT)源自著名的维纳指数。描述了χT在测定热解二氧化硅表面能的分散成分以及评估层状二氧化硅几何不均匀性方面的应用。此外,对针铁矿和氧化锆样品进行了类似的分析。版权所有1997年学术出版社。版权所有1997年学术出版社

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