Selemon L D, Rajkowska G, Goldman-Rakic P S
Section of Neurobiology, Yale University School of Medicine, New Haven, Connecticut 06510, USA.
J Comp Neurol. 1998 Mar 16;392(3):402-12.
Neuropsychologic testing in schizophrenic patients has underscored the prominence of dysfunction in cognitive processes associated with the dorsolateral prefrontal cortex. Quantitative cytometric analysis of area 46 was undertaken in brains from schizophrenic patients to determine whether there are morphologic changes underlying these cognitive deficits. Postmortem brain specimens from 9 schizophrenic patients, 10 normal subjects, and 8 Huntington's diseased patients were fixed in formalin and celloidin embedded. A direct, three-dimensional counting method was used to determine cell density and cortical thickness in Nissl-stained sections of area 46. Overall neuronal density was 21% greater in brains from schizophrenic patients in comparison to normal controls. Significant elevations in neuronal density were observed in layers II, III, IV, and VI. The cortical ribbon was slightly (8%) but not significantly thinner. However, layer II exhibited disproportionate thinning compared with all other layers. In brains from Huntington's diseased patients, increases in neuronal (35%) and glial (61%) density with substantial cortical thinning (30%) were observed. The neuropathology of area 46 in schizophrenia is similar in direction and magnitude to that previously described in area 9 (Selemon et al. [1995] Arch. Gen. Psychiatry 52:805-818), except for the abnormalities in layer II, which are specific to area 46. In contrast to Huntington's disease, in which cortical atrophy and gliosis are present, no evidence for cortical cell loss was uncovered in the schizophrenic cohort. The observed elevation in neuronal density suggests that a reduction in interneuronal neuropil may constitute the anatomical substrate for prefrontal cortical dysfunction in schizophrenia.
对精神分裂症患者进行的神经心理学测试突出了与背外侧前额叶皮质相关的认知过程功能障碍的显著程度。对精神分裂症患者的大脑进行了46区的定量细胞计数分析,以确定这些认知缺陷是否存在形态学变化。来自9名精神分裂症患者、10名正常受试者和8名亨廷顿病患者的尸检脑标本用福尔马林固定并包埋在火棉胶中。采用直接三维计数法测定46区尼氏染色切片中的细胞密度和皮质厚度。与正常对照组相比,精神分裂症患者大脑中的总体神经元密度高21%。在第II、III、IV和VI层观察到神经元密度显著升高。皮质带略薄(8%),但无显著差异。然而,与所有其他层相比,第II层表现出不成比例的变薄。在亨廷顿病患者的大脑中,观察到神经元密度(35%)和胶质细胞密度(61%)增加,同时皮质显著变薄(30%)。精神分裂症中46区的神经病理学在方向和程度上与先前在9区描述的相似(Selemon等人[1995年]《普通精神病学文献》52:805 - 818),但第II层的异常是46区特有的。与存在皮质萎缩和胶质增生的亨廷顿病不同,在精神分裂症队列中未发现皮质细胞丢失的证据。观察到的神经元密度升高表明,中间神经元神经毡的减少可能构成精神分裂症前额叶皮质功能障碍的解剖学基础。