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二元响应的广义估计方程(GEE)建模的拟合优度检验。

Goodness-of-fit tests for GEE modeling with binary responses.

作者信息

Barnhart H X, Williamson J M

机构信息

Department of Biostatistics, Rollins School of Public Health of Emory University, Atlanta, Georgia 30322, USA.

出版信息

Biometrics. 1998 Jun;54(2):720-9.

PMID:9629652
Abstract

Analysis of data with repeated measures is often accomplished through the use of generalized estimating equations (GEE) methodology. Although methods exist for assessing the adequacy of the fitted models for uncorrelated data with likelihood methods, it is not appropriate to use these methods for models fitted with GEE methodology. We propose model-based and robust (empirically corrected) goodness-of-fit tests for GEE modeling with binary responses based on partitioning the space of covariates into distinct regions and forming score statistics that are asymptotically distributed as chi-square random variables with the appropriate degrees of freedom. The null distribution and the statistical power of the proposed goodness-of-fit tests were assessed using simulated data. The proposed goodness-of-fit tests are illustrated by two examples using data from clinical studies.

摘要

重复测量数据的分析通常通过使用广义估计方程(GEE)方法来完成。尽管存在使用似然方法评估不相关数据拟合模型充分性的方法,但将这些方法用于GEE方法拟合的模型并不合适。我们基于将协变量空间划分为不同区域并形成渐近分布为具有适当自由度的卡方随机变量的得分统计量,提出了用于二元响应的GEE建模的基于模型和稳健(经验校正)的拟合优度检验。使用模拟数据评估了所提出的拟合优度检验的零分布和统计功效。通过两个使用临床研究数据的例子说明了所提出的拟合优度检验。

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