Joy D C
University of Tennessee, Knoxville 37996-0810, USA.
J Microsc. 1998 Jul;191(Pt 1):74-82. doi: 10.1046/j.1365-2818.1998.00329.x.
The absolute efficiency of X-ray production has been determined for the K-lines of Al, Si and Cu; for the L-lines of Fe, Co, Cu, Ge and As; and for the M-lines of Hf, Ir, Pt, Au and Bi, using overvoltage ratios in the range 1-10. These emissions, with the exception of the Cu K, have critical excitation energies below 2.6 keV and are therefore typical of the lines used for X-ray microanalysis at low beam energies. For K-lines it is found that the experimental results are in good agreement with a Bethe, or a Casnati, crosssection model. For the L- and M-lines a Monte Carlo technique has been used to find an effective X-ray generation cross-section for each of the elements. The functional forms of these cross-sections are found to be in general agreement with proposed theoretical models.
利用1至10范围内的过电压比,已确定了铝、硅和铜的K线;铁、钴、铜、锗和砷的L线;以及铪、铱、铂、金和铋的M线的X射线产生绝对效率。除了铜K线外,这些发射的临界激发能低于2.6 keV,因此是低束能下用于X射线微分析的典型谱线。对于K线,发现实验结果与贝特或卡斯纳蒂截面模型吻合良好。对于L线和M线,已使用蒙特卡罗技术来确定每种元素的有效X射线产生截面。发现这些截面的函数形式与所提出的理论模型总体一致。