Paggel JJ, Miller T, Chiang T
Department of Physics, University of Illinois, 1110 West Green Street, Urbana, IL 61801, USA, and Frederick Seitz Materials Research Laboratory, University of Illinois, 104 South Goodwin Avenue, Urbana, IL 61801, USA.
Science. 1999 Mar 12;283(5408):1709-11. doi: 10.1126/science.283.5408.1709.
Angle-resolved photoemission from atomically uniform silver films on iron (100) shows quantum-well states for absolutely determined film thicknesses ranging from 1 to approximately 100 monolayers. These states can be understood in terms of Fabry-Perot modes in an electron interferometer. A quantitative line shape analysis over the entire two orders of magnitude of thickness range yields an accurate measurement of the band structure, quasiparticle lifetime, electron reflectivity, and phase shift. Effects of confinement energy gap, reflection loss, and surface scattering caused by controlled roughness are demonstrated.
对铁（100）上原子均匀银膜的角分辨光电子能谱显示，对于绝对确定的膜厚度范围从1到约100个单层，存在量子阱态。这些态可以用电子干涉仪中的法布里 - 珀罗模式来理解。在整个两个数量级的厚度范围内进行定量线形分析，可以精确测量能带结构、准粒子寿命、电子反射率和相移。展示了由可控粗糙度引起的限制能隙、反射损耗和表面散射的影响。
