Crewe A V, Lin P S
Ultramicroscopy. 1976 Jun;1(3):231-8. doi: 10.1016/0304-3991(76)90037-1.
It is shown that the use of a very large detector for backscattered electrons can provide a signal comparable to that obtained in the secondary emission mode and that the resolution available is also comparable. A technique is described whereby the difference is taken between these two signals, and the use of this difference signal can significantly enhance surface details. It is believed that the use of such a signal should ultimately prove advantageous in increasing resolution.
结果表明，使用一个非常大的背散射电子探测器可以提供与二次发射模式下获得的信号相当的信号，并且可用分辨率也相当。本文描述了一种技术，即获取这两个信号之间的差值，使用这种差值信号可以显著增强表面细节。据信，使用这样的信号最终应会在提高分辨率方面证明是有利的。
