Cowley J M
Department of Physics and Astronomy, Arizona State University, Tempe, Arizona 85287-1504, USA.
Microsc Res Tech. 1999 Jul 15;46(2):75-97. doi: 10.1002/(SICI)1097-0029(19990715)46:2<75::AID-JEMT2>3.0.CO;2-S.
Electron nanodiffraction, particularly as performed in a dedicated STEM instrument with coherent illumination, provides, in principle, a means for obtaining information on structural detail in the range between that of STEM image resolution, about 0.2 nm, and the limits of information possible from elastic scattering from atoms, about 0. 03 nm. In practice, most nanodiffraction work has been concerned with finding the crystal structure, crystal defects, and sometimes crystal shapes for nanoparticles in the size range of 1-2 nm or for regions of thin crystalline films of about these dimensions. Available equipment allows for the recording of nanodiffraction patterns at the rate of 30 per second, or faster, providing means for detailed study of extended areas or of dynamical processes.
电子纳米衍射，特别是在配备相干照明的专用扫描透射电子显微镜（STEM）仪器中进行时，原则上提供了一种获取结构细节信息的方法，该信息范围介于STEM图像分辨率（约0.2纳米）和原子弹性散射所能提供的信息极限（约0.03纳米）之间。实际上，大多数纳米衍射工作一直致力于确定尺寸范围为1 - 2纳米的纳米颗粒或尺寸约为此的薄晶体薄膜区域的晶体结构、晶体缺陷，有时还包括晶体形状。现有设备能够以每秒30次或更快的速度记录纳米衍射图案，为详细研究扩展区域或动态过程提供了手段。
