Svergun D I, Petoukhov M V, Koch M H, König S
European Molecular Biology Laboratory, Hamburg Outstation, Deutsches Elektronen Synchrotron, Notkestrasse 85, D-22603 Hamburg, Germany.
J Biol Chem. 2000 Jan 7;275(1):297-302. doi: 10.1074/jbc.275.1.297.
The quaternary structures of the thiamine diphosphate-dependent enzymes transketolase (EC 2.2.1.1; from Saccharomyces cerevisiae), pyruvate oxidase (EC 1.2.3.3; from Lactobacillus plantarum), and pyruvate decarboxylase (EC 4.1.1.1; from Zymomonas mobilis and brewers' yeast, the latter in the native and pyruvamide-activated forms) were examined by synchrotron x-ray solution scattering. The experimental scattering data were compared with the curves calculated from the crystallographic models of these multisubunit enzymes. For all enzymes noted above, except the very compact pyruvate decarboxylase from Z. mobilis, there were significant differences between the experimental and calculated profiles. The changes in relative positions of the subunits in solution were determined by rigid body refinement. For pyruvate oxidase and transketolase, which have tight intersubunit contacts in the crystal, relatively small modifications of the quaternary structure (root mean square displacements of 0.23 and 0.27 nm, respectively) sufficed to fit the experimental data. For the enzymes with looser contacts (the native and activated forms of yeast pyruvate decarboxylase), large modifications of the crystallographic models (root mean square displacements of 0.58 and 1.53 nm, respectively) were required. A clear correlation was observed between the magnitude of the distortions induced by the crystal environment and the interfacial area between subunits.
通过同步辐射X射线溶液散射研究了硫胺素二磷酸依赖性酶转酮醇酶(EC 2.2.1.1;来自酿酒酵母)、丙酮酸氧化酶(EC 1.2.3.3;来自植物乳杆菌)和丙酮酸脱羧酶(EC 4.1.1.1;来自运动发酵单胞菌和酿酒酵母,后者为天然形式和丙酮酸酰胺激活形式)的四级结构。将实验散射数据与从这些多亚基酶的晶体学模型计算出的曲线进行了比较。对于上述所有酶,除了来自运动发酵单胞菌的非常紧密的丙酮酸脱羧酶外,实验曲线和计算曲线之间存在显著差异。通过刚体精修确定了溶液中亚基相对位置的变化。对于在晶体中有紧密亚基间接触的丙酮酸氧化酶和转酮醇酶,四级结构的相对较小修饰(均方根位移分别为0.23和0.27 nm)足以拟合实验数据。对于接触较松散的酶(酵母丙酮酸脱羧酶的天然形式和激活形式),则需要对晶体学模型进行较大修饰(均方根位移分别为0.58和1.53 nm)。观察到晶体环境引起的扭曲程度与亚基间界面面积之间存在明显的相关性。