提高飞利浦CM系列透射电子显微镜上测角仪的定位精度。

Improving the positional accuracy of the goniometer on the Philips CM series TEM.

作者信息

Pulokas J, Green C, Kisseberth N, Potter C S, Carragher B

机构信息

Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, 405 North Mathews Avenue, Urbana, Illinois, 61801, USA.

出版信息

J Struct Biol. 1999 Dec 30;128(3):250-6. doi: 10.1006/jsbi.1999.4181.

DOI:10.1006/jsbi.1999.4181

PMID:10633064

Abstract

We have developed a method to improve the accuracy for absolute relocation of a target specimen using the goniometer on a Philips transmission electron microscope. We have achieved this by characterizing the performance of the Philips compustage, modeling its behavior, and using this model to calculate the goniometer movements required for accurate target relocation. This resulted in a 10-fold improvement in the positioning accuracy of the goniometer.

摘要

我们开发了一种方法，可提高在飞利浦透射电子显微镜上使用测角仪对目标样本进行绝对重新定位的准确性。我们通过表征飞利浦计算机控制载物台的性能、对其行为进行建模，并使用该模型计算准确重新定位目标所需的测角仪移动量来实现这一目标。这使得测角仪的定位精度提高了10倍。