Zhao Y P, Fortin J B, Bonvallet G, Wang G C, Lu T M
Department of Physics, Applied Physics, and Astronomy, Rensselaer Polytechnic Institute, Troy, New York 12180-3590, USA.
Phys Rev Lett. 2000 Oct 9;85(15):3229-32. doi: 10.1103/PhysRevLett.85.3229.
The growth front roughness of linear poly( p-xylylene) films grown by vapor deposition polymerization has been investigated using atomic force microscopy. The interface width w increases as a power law of film thickness d, w approximately d(beta), with beta = 0. 25+/-0.03, and the lateral correlation length xi grows as xi approximately d(1/z), with 1/z = 0.31+/-0.02. This novel scaling behavior is interpreted as the result of monomer bulk diffusion, and belongs to a new universality class that has not been discussed previously.
利用原子力显微镜研究了通过气相沉积聚合生长的线性聚对二甲苯薄膜的生长前沿粗糙度。界面宽度w随薄膜厚度d呈幂律增长，w约为d(β)，其中β = 0.25±0.03，横向关联长度ξ随ξ约为d(1/z)增长，其中1/z = 0.31±0.02。这种新颖的标度行为被解释为单体体扩散的结果，属于一个此前未被讨论过的新普适类。
