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磁共振成像(MRI)期间烧伤相关因素的调查。

Investigation of the factors responsible for burns during MRI.

作者信息

Dempsey M F, Condon B, Hadley D M

机构信息

Institute of Neurological Sciences, Southern General Hospital, Glasgow, UK.

出版信息

J Magn Reson Imaging. 2001 Apr;13(4):627-31. doi: 10.1002/jmri.1088.

Abstract

Numerous reported burn injuries have been sustained during clinical MRI procedures. The aim of this study was to investigate the possible factors that may be responsible for such burns. Experiments were performed to investigate three possible mechanisms for causing heating in copper wire during MRI: direct electromagnetic induction in a conductive loop, induction in a resonant conducting loop, and electric field resonant coupling with a wire (the antenna effect). Maximum recorded temperature rises were 0.6 degrees C for the loop, 61.1 degrees C for the resonant loop, and 63.5 degrees C for the resonant antenna. These experimental findings suggest that, contrary to common belief, it is unlikely that direct induction in a conductive loop will result in thermal injury. Burn incidents are more likely to occur due to the formation of resonant conducting loops and from extended wires forming resonant antenna. The characteristics of resonance should be considered when formulating safety guidelines.

摘要

在临床磁共振成像(MRI)检查过程中,已有多起烧伤事故的报道。本研究旨在探究可能导致此类烧伤的因素。进行了实验以研究MRI过程中铜丝发热的三种可能机制:导电回路中的直接电磁感应、谐振导电回路中的感应以及与导线的电场谐振耦合(天线效应)。记录到的回路最高温度升高为0.6摄氏度,谐振回路为61.1摄氏度,谐振天线为63.5摄氏度。这些实验结果表明,与普遍看法相反,导电回路中的直接感应不太可能导致热损伤。烧伤事故更有可能是由于谐振导电回路的形成以及延长导线形成谐振天线所致。在制定安全指南时应考虑共振特性。

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