Murthy M S, Rao B S, Reddy N M, Subrahmanyam P, Madhvanath U
Mutat Res. 1975 Feb;27(2):219-23. doi: 10.1016/0027-5107(75)90080-9.
In yeast reversion studies, assay of the total number of cells is made by plating irradiated cells on agar plates containing yeast extract, peptone and dextrose (YEPD) medium. The number of revertants are scored by plating cells on synthetic complete (SC) medium deficient in the particular nutrient for which the reversion is tested. In this procedure equivalence for cell survival between the YEPD and the SC media is always assumed. However it is shown in this paper that this assumption is valid only up to dose levels where cell killing is not significant. At high doses, survivals on the two media differ significantly from each other for both high and low LET radiations. This difference influences the slope of the reversion frequency curve at high doses. Since the reversion frequency is expressed with reference to the number of survivors after a given radiation dose, it is essential to see that the same chance of survival is offered to the reverted and unreverted cells. Even though reversion is reported to vary linearly with dose, it is found that this linearity is restricted only to dose levels where cell killing is not significant. At higher doses, the reversion frequency varies in a very complex manner with dose for both high and low LET radiations. The complexity depends further on the reference medium chosen.
在酵母回复突变研究中,通过将经辐照的细胞接种在含有酵母提取物、蛋白胨和葡萄糖(YEPD)培养基的琼脂平板上来测定细胞总数。通过将细胞接种在缺乏用于测试回复突变的特定营养素的合成完全(SC)培养基上对回复突变体进行计数。在此过程中,总是假定YEPD培养基和SC培养基之间细胞存活的等效性。然而,本文表明,该假设仅在细胞杀伤不显著的剂量水平内有效。在高剂量下,对于高LET和低LET辐射,两种培养基上的存活率彼此显著不同。这种差异会影响高剂量下回复突变频率曲线的斜率。由于回复突变频率是相对于给定辐射剂量后的存活细胞数来表示的,因此必须确保回复突变细胞和未回复突变细胞有相同的存活机会。尽管据报道回复突变与剂量呈线性变化,但发现这种线性仅局限于细胞杀伤不显著的剂量水平。在较高剂量下,对于高LET和低LET辐射,回复突变频率随剂量以非常复杂的方式变化。这种复杂性进一步取决于所选择的参考培养基。