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负折射率的实验验证。

Experimental verification of a negative index of refraction.

作者信息

Shelby R A, Smith D R, Schultz S

机构信息

Department of Physics, University of California, San Diego, La Jolla, CA 92093-0350, USA.

出版信息

Science. 2001 Apr 6;292(5514):77-9. doi: 10.1126/science.1058847.

Abstract

We present experimental scattering data at microwave frequencies on a structured metamaterial that exhibits a frequency band where the effective index of refraction (n) is negative. The material consists of a two-dimensional array of repeated unit cells of copper strips and split ring resonators on interlocking strips of standard circuit board material. By measuring the scattering angle of the transmitted beam through a prism fabricated from this material, we determine the effective n, appropriate to Snell's law. These experiments directly confirm the predictions of Maxwell's equations that n is given by the negative square root of epsilon.mu for the frequencies where both the permittivity (epsilon) and the permeability (mu) are negative. Configurations of geometrical optical designs are now possible that could not be realized by positive index materials.

摘要

我们展示了在微波频率下,关于一种结构化超材料的实验散射数据,该超材料呈现出一个有效折射率(n)为负的频段。这种材料由重复单元的二维阵列组成,单元由铜条和位于标准电路板材料互锁条上的裂环谐振器构成。通过测量透过用这种材料制成的棱镜的透射光束的散射角,我们确定了符合斯涅尔定律的有效折射率n。这些实验直接证实了麦克斯韦方程组的预测,即在介电常数(ε)和磁导率(μ)均为负的频率下,n由εμ的负平方根给出。现在有可能实现一些几何光学设计构型,而这些构型是正折射率材料无法实现的。

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