Keast V J, Scott A J, Brydson R, Williams D B, Bruley J
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke St., Cambridge, CB2 3QZ, UK.
J Microsc. 2001 Aug;203(Pt 2):135-75. doi: 10.1046/j.1365-2818.2001.00898.x.
Electron energy-loss near-edge structure (ELNES) is a technique that can be used to measure the electronic structure (i.e. bonding) in materials with subnanometre spatial resolution. This review covers the theoretical principles behind the technique, the experimental procedures necessary to acquire good ELNES spectra, including potential artefacts, and gives examples relevant to materials science.
电子能量损失近边结构（ELNES）是一种可用于测量具有亚纳米空间分辨率的材料中电子结构（即键合）的技术。本综述涵盖了该技术背后的理论原理、获取良好ELNES光谱所需的实验程序，包括潜在的假象，并给出了与材料科学相关的示例。
