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用于高分辨率电子能量损失近边结构测量的离子液体超薄透射电子显微镜样品的制备。

Fabrication of thin TEM sample of ionic liquid for high-resolution ELNES measurements.

作者信息

Miyata Tomohiro, Mizoguchi Teruyasu

机构信息

Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan.

出版信息

Ultramicroscopy. 2017 Jul;178:81-87. doi: 10.1016/j.ultramic.2016.10.009. Epub 2016 Oct 19.

Abstract

Investigation of the local structure, ionic and molecular behavior, and chemical reactions at high spatial resolutions in liquids has become increasingly important. Improvements in these areas help to develop efficient batteries and improve organic syntheses. Transmission electron microscopy (TEM) and scanning-TEM (STEM) have excellent spatial resolution, and the electron energy-loss near edge structure (ELNES) measured by the accompanied electron energy-loss spectroscopy (EELS) is effective to analyze the liquid local structure owing to reflecting the electronic density of states. In this study, we fabricate a liquid-layer-only sample with thickness of single to tens nanometers using an ionic liquid. Because the liquid film has a thickness much less than the inelastic mean free path (IMFP) of the electron beam, the fine structure of the C-K edge electron energy loss near edge structure (ELNES) can be measured with sufficient resolution to allow meaningful analysis. The ELNES spectrum from the thin liquid film has been interpreted using first principles ELNES calculations.

摘要

在液体中以高空间分辨率研究局部结构、离子和分子行为以及化学反应变得越来越重要。这些领域的进展有助于开发高效电池并改进有机合成。透射电子显微镜(TEM)和扫描透射电子显微镜(STEM)具有出色的空间分辨率,并且通过伴随的电子能量损失谱(EELS)测量的电子能量损失近边结构(ELNES)由于反映了态密度的电子密度,对于分析液体局部结构是有效的。在本研究中,我们使用离子液体制造了厚度为单纳米到几十纳米的仅液体层样品。由于液膜的厚度远小于电子束的非弹性平均自由程(IMFP),因此可以以足够的分辨率测量C-K边电子能量损失近边结构(ELNES)的精细结构,以便进行有意义的分析。已经使用第一性原理ELNES计算对来自薄液膜的ELNES光谱进行了解释。

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