Stewart K J, Seuntjens J P
Department of Medical Physics, McGill University Health Centre, Montreal General Hospital, Canada.
Med Phys. 2002 Mar;29(3):284-9. doi: 10.1118/1.1449876.
Recent absorbed-dose-based protocols allow for two methods of calibrating electron beams using plane-parallel chambers, one using the N(Co)D,w for a plane-parallel chamber, and the other relying on cross-calibration of the plane-parallel chamber in a high-energy electron beam against a cylindrical chamber which has an N(Co)D,w factor. The second method is recommended as it avoids problems associated with the Pwall correction factors at 60Co for plane-parallel chambers which are used in the determination of the beam quality conversion factors. In this article we investigate the consistency of these two methods for the PTW Roos, Scanditronics NACP02, and PTW Markus chambers. We processed our data using both the AAPM TG-51 and the IAEA TRS-398 protocols. Wall correction factors in 60Co beams and absorbed-dose beam quality conversion factors for 20 MeV electrons were derived for these chambers by cross-calibration against a cylindrical ionization chamber. Systematic differences of up to 1.6% were found between our values of Pwall and those from the Monte Carlo calculations underlying AAPM TG-51, and up to 0.6% when comparing with the IAEA TRS-398 protocol. The differences in Pwall translate directly into differences in the beam quality conversion factors in the respective protocols. The relatively large spread in the experimental data of Pwall, and consequently the absorbed-dose beam quality conversion factor, confirms the importance of the cross-calibration technique when using plane-parallel chambers for calibrating clinical electron beams. We confirmed that for well-guarded plane-parallel chambers, the fluence perturbation correction factor at d(max) is not significantly different from the value at d(ref). For the PTW Markus chamber the variation in the latter factor is consistent with published fits relating it to average energy at depth.
最近基于吸收剂量的方案允许使用平行板电离室对电子束进行两种校准方法,一种使用平行板电离室的N(Co)D,w,另一种则依靠在高能电子束中将平行板电离室与具有N(Co)D,w因子的圆柱形电离室进行交叉校准。推荐第二种方法,因为它避免了在确定射束质转换因子时使用的平行板电离室在60Co时与Pwall校正因子相关的问题。在本文中,我们研究了这两种方法对于PTW Roos、Scanditronics NACP02和PTW Markus电离室的一致性。我们使用AAPM TG - 51和IAEA TRS - 398方案处理了我们的数据。通过与圆柱形电离室进行交叉校准,得出了这些电离室在60Co射束中的壁校正因子以及20 MeV电子的吸收剂量射束质转换因子。我们得到的Pwall值与AAPM TG - 51所依据的蒙特卡罗计算值之间的系统差异高达1.6%,与IAEA TRS - 398方案相比差异高达0.6%。Pwall的差异直接转化为各自方案中射束质转换因子的差异。Pwall实验数据中相对较大的离散度,以及因此吸收剂量射束质转换因子的离散度,证实了在使用平行板电离室校准临床电子束时交叉校准技术的重要性。我们证实,对于防护良好的平行板电离室,d(max)处的注量扰动校正因子与d(ref)处的值没有显著差异。对于PTW Markus电离室,后一个因子的变化与已发表的将其与深度处平均能量相关的拟合结果一致。