Díaz-Sánchez A, Pérez-Garrido A, Urbina A, Catalá J D
Departamento de Física Aplicada, Universidad Politécnica de Cartagena, Campus Muralla del Mar, Cartagena, E-30202 Murcia, Spain.
Phys Rev E Stat Nonlin Soft Matter Phys. 2002 Sep;66(3 Pt 1):031403. doi: 10.1103/PhysRevE.66.031403. Epub 2002 Sep 10.
We study the relaxation for growing interfaces in quenched disordered media. We use a directed percolation depinning model introduced by Tang and Leschhorn for 1+1 dimensions. We define the two-time autocorrelation function of the interface height C(t('),t) and its Fourier transform. These functions depend on the difference of times t-t(') for long enough times, this is the steady-state regime. We find a two-step relaxation decay in this regime. The long time tail can be fitted by a stretched exponential relaxation function. The relaxation time tau(alpha) is proportional to the characteristic distance of the clusters of pinning cells in the direction parallel to the interface and it diverges as a power law. The two-step relaxation is lost at a given wavelength of the Fourier transform, which is proportional to the characteristic distance of the clusters of pinning cells in the direction perpendicular to the interface. The stretched exponential relaxation is caused by the existence of clusters of pinning cells and it is a direct consequence of the quenched noise.
我们研究了淬火无序介质中生长界面的弛豫过程。我们使用了由唐和莱斯霍恩引入的用于1 + 1维的定向渗流脱钉模型。我们定义了界面高度的双时自相关函数C(t′,t)及其傅里叶变换。对于足够长的时间,这些函数取决于时间差t - t′,这就是稳态 regime。我们在这个 regime 中发现了两步弛豫衰减。长时间尾部可以用拉伸指数弛豫函数拟合。弛豫时间τ(α)与平行于界面方向上钉扎单元簇的特征距离成正比,并且它以幂律发散。在傅里叶变换的给定波长处,两步弛豫消失,该波长与垂直于界面方向上钉扎单元簇的特征距离成正比。拉伸指数弛豫是由钉扎单元簇的存在引起的,并且是淬火噪声的直接结果。