Lu Sheng-Hua, Chiueh Ching-I, Lee Cheng-Chung
The authors are with the Institute of Optical Sciences, National Central University, Jungli City, Taoyuan, Taiwan.
Appl Opt. 2002 Oct 1;41(28):5866-71. doi: 10.1364/ao.41.005866.
An interferometer based on the differential heterodyne configuration and wavelength-scanning interferometry for measuring large step heights is presented. The proposed interferometer is less sensitive to environmental disturbances than other interferometers and can accurately measure interference phases. A tunable diode laser is utilized to illuminate the interferometer and thus solve the phase ambiguity problem. Counting the interference fringes as the wavelength is scanned through a known change in wavelength directly determines the step height. Three gauge blocks of different lengths, 5, 10, and 50 mm, are individually wrung on a steel plate to simulate large step heights. Comparing the results measured by the proposed interferometer with those by the gauge block interferometer reveals that the accuracy is approximately 100 nm.
提出了一种基于差动外差配置和波长扫描干涉测量法的干涉仪,用于测量大台阶高度。所提出的干涉仪比其他干涉仪对环境干扰的敏感度更低,并且能够精确测量干涉相位。利用可调谐二极管激光器照射干涉仪,从而解决相位模糊问题。当波长扫描通过已知的波长变化时,对干涉条纹进行计数可直接确定台阶高度。将三个不同长度(5毫米、10毫米和50毫米)的量块分别研合在一块钢板上,以模拟大台阶高度。将所提出的干涉仪测量的结果与量块干涉仪测量的结果进行比较,结果表明精度约为100纳米。